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Material removal mechanism of copper chemical mechanical polishing with different particle sizes based on quasi-continuum method
Zhu, Aibin; He, Dayong; He, Shengli; Luo, Wencheng
刊名FRICTION
2017
卷号5页码:99-107
关键词particle size chemical mechanical polishing material removal mechanism quasi-continuum single crystal copper
ISSN号2223-7690
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2941303
专题西安交通大学
推荐引用方式
GB/T 7714
Zhu, Aibin,He, Dayong,He, Shengli,et al. Material removal mechanism of copper chemical mechanical polishing with different particle sizes based on quasi-continuum method[J]. FRICTION,2017,5:99-107.
APA Zhu, Aibin,He, Dayong,He, Shengli,&Luo, Wencheng.(2017).Material removal mechanism of copper chemical mechanical polishing with different particle sizes based on quasi-continuum method.FRICTION,5,99-107.
MLA Zhu, Aibin,et al."Material removal mechanism of copper chemical mechanical polishing with different particle sizes based on quasi-continuum method".FRICTION 5(2017):99-107.
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