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Improved electron emission properties of the porous silicon emitter by chemical surface modification
Wang, Wenjiang; He, Li; Zhang, Xiaoning; Zhang, He
刊名SEMICONDUCTOR SCIENCE AND TECHNOLOGY
2017
卷号32
关键词electron emission characteristics chemical dipping method metal contact properties porous silicon
ISSN号0268-1242
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2935220
专题西安交通大学
推荐引用方式
GB/T 7714
Wang, Wenjiang,He, Li,Zhang, Xiaoning,et al. Improved electron emission properties of the porous silicon emitter by chemical surface modification[J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY,2017,32.
APA Wang, Wenjiang,He, Li,Zhang, Xiaoning,&Zhang, He.(2017).Improved electron emission properties of the porous silicon emitter by chemical surface modification.SEMICONDUCTOR SCIENCE AND TECHNOLOGY,32.
MLA Wang, Wenjiang,et al."Improved electron emission properties of the porous silicon emitter by chemical surface modification".SEMICONDUCTOR SCIENCE AND TECHNOLOGY 32(2017).
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