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A Bilateral Constrained Image Reconstruction Method Using Electrical Impedance Tomography and Ultrasonic Measurement
Hao Liu; Shu Zhao; Chao Tan; Feng Dong
刊名IEEE Sensors Journal
2019
卷号Vol.19 No.21页码:9883-9895
关键词Tomography Image reconstruction Conductivity Electrodes Conductivity measurement Voltage measurement Sensors Electrical impedance tomography dual-modality reconstruction bilateral constraint ultrasound measurement augment Lagrange method
ISSN号1530-437X;1558-1748
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2929338
专题天津大学
作者单位Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China Institute of Biomedical Engineering, Chinese Academy of Medical Sciences and Peking Union Medical College, Tianjin, China Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China
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Hao Liu,Shu Zhao,Chao Tan,et al. A Bilateral Constrained Image Reconstruction Method Using Electrical Impedance Tomography and Ultrasonic Measurement[J]. IEEE Sensors Journal,2019,Vol.19 No.21:9883-9895.
APA Hao Liu,Shu Zhao,Chao Tan,&Feng Dong.(2019).A Bilateral Constrained Image Reconstruction Method Using Electrical Impedance Tomography and Ultrasonic Measurement.IEEE Sensors Journal,Vol.19 No.21,9883-9895.
MLA Hao Liu,et al."A Bilateral Constrained Image Reconstruction Method Using Electrical Impedance Tomography and Ultrasonic Measurement".IEEE Sensors Journal Vol.19 No.21(2019):9883-9895.
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