| Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides | |
| Mi, Shaobo; Jia, Chunlin | |
| 刊名 | Materials China
 |
| 2017 | |
| 卷号 | 36页码:566-574 |
| 关键词 | Aberration-corrected high-resolution transmission electron microscopy Interface Microstructure Negative CS imaging technique Oxides |
| ISSN号 | 1674-3962 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2927616 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Mi, Shaobo,Jia, Chunlin. Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides[J]. Materials China,2017,36:566-574. |
| APA | Mi, Shaobo,&Jia, Chunlin.(2017).Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides.Materials China,36,566-574. |
| MLA | Mi, Shaobo,et al."Aberration-Corrected High-Resolution Transmission Electron Microscopy and Its Applications in Functional Oxides".Materials China 36(2017):566-574. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论