Research on erosion rate of contacts for MCCB in short circuit conditions | |
Yin, Nairui; Liu, Hongwu; Guan, Ruiliang; Xie, Xinyi | |
2017 | |
关键词 | Breaking process Circuit parameter Contact erosion Current interruption MCCB Oscillating circuits Short-circuit conditions Split electrode |
页码 | 55-58 |
会议录 | ICREPEC 2017 - Proceedings of the 6th International Conference on Reliability of Electrical Products and Electrical Contacts |
URL标识 | 查看原文 |
ISSN号 | 9789881532398 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2924874 |
专题 | 西安交通大学 |
推荐引用方式 GB/T 7714 | Yin, Nairui,Liu, Hongwu,Guan, Ruiliang,et al. Research on erosion rate of contacts for MCCB in short circuit conditions[C]. 见:. |
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