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	Charge state effect on K-shell ionization of silicon induced by iodine(q+) ions
	Lei, Yu; Cheng, Rui; Zhou, Xianming; Wang, Xing; Wang, Yuyu; Ren, Jieru; Zhao, Yongtao; Ma, Xinwen; Xiao, Guoqing
刊名	EUROPEAN PHYSICAL JOURNAL D
	2018
卷号	72
ISSN号	1434-6060
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2920782
专题	西安交通大学
推荐引用方式 GB/T 7714	Lei, Yu,Cheng, Rui,Zhou, Xianming,et al. Charge state effect on K-shell ionization of silicon induced by iodine(q+) ions[J]. EUROPEAN PHYSICAL JOURNAL D,2018,72.
APA	Lei, Yu.,Cheng, Rui.,Zhou, Xianming.,Wang, Xing.,Wang, Yuyu.,...&Xiao, Guoqing.(2018).Charge state effect on K-shell ionization of silicon induced by iodine(q+) ions.EUROPEAN PHYSICAL JOURNAL D,72.
MLA	Lei, Yu,et al."Charge state effect on K-shell ionization of silicon induced by iodine(q+) ions".EUROPEAN PHYSICAL JOURNAL D 72(2018).

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