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Comparison of the performance improvement for the two novel SOI-tunnel FETs with the lateral dual-gate and triple-gate
Wei, Sufen; Zhang, Guohe; Geng, Li; Shao, Zhibiao; Yang, Cheng-Fu
刊名Microsystem Technologies
2018
关键词Band to band tunneling Compare and analyze Modulating effect Off-state current On state current Performance improvements Tunnel field-effect transistors (TFET) Tunneling barrier
ISSN号0946-7076
URL标识查看原文
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2920111
专题西安交通大学
推荐引用方式
GB/T 7714
Wei, Sufen,Zhang, Guohe,Geng, Li,et al. Comparison of the performance improvement for the two novel SOI-tunnel FETs with the lateral dual-gate and triple-gate[J]. Microsystem Technologies,2018.
APA Wei, Sufen,Zhang, Guohe,Geng, Li,Shao, Zhibiao,&Yang, Cheng-Fu.(2018).Comparison of the performance improvement for the two novel SOI-tunnel FETs with the lateral dual-gate and triple-gate.Microsystem Technologies.
MLA Wei, Sufen,et al."Comparison of the performance improvement for the two novel SOI-tunnel FETs with the lateral dual-gate and triple-gate".Microsystem Technologies (2018).
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