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	VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment
	Yan, Junkai; Wang, Jianguo; Tang, Chuanxiang; Liu, Xiaolong; Yang, Meng; Hao, Wenxi; He, Yanyang
刊名	IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
	2018
卷号	60页码:234-242
关键词	status monitor Effects diagnosis high-power electromagnetic (HPEM) susceptibility test electronic equipment vertical-cavity surface-emitting laser (VCSEL)
ISSN号	0018-9375
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2918820
专题	西安交通大学
推荐引用方式 GB/T 7714	Yan, Junkai,Wang, Jianguo,Tang, Chuanxiang,et al. VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment[J]. IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY,2018,60:234-242.
APA	Yan, Junkai.,Wang, Jianguo.,Tang, Chuanxiang.,Liu, Xiaolong.,Yang, Meng.,...&He, Yanyang.(2018).VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment.IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY,60,234-242.
MLA	Yan, Junkai,et al."VCSEL-Based In-Circuit Status-Monitoring and Effects-Diagnosis Method for HPEM Susceptibility Test on Digital Electronic Equipment".IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY 60(2018):234-242.

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