| Correlation Between Dielectric Breakdown and Interface Traps Characteristics | |
| Xie, Dongri; Min, Daomin; Liu, Wenfeng; Li, Shengtao; Kang, Wenbin; Min, Chao | |
| 刊名 | Gaodianya Jishu/High Voltage Engineering
 |
| 2018 | |
| 卷号 | 44页码:432-439 |
| 关键词 | Breakdown Carrier multiplication Collision ionization High field strengths Polypropylene nanocomposites Power capacitor Thermally stimulated depolarization currents Traps |
| ISSN号 | 1003-6520 |
| URL标识 | 查看原文 |
| 内容类型 | 期刊论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2917935 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Xie, Dongri,Min, Daomin,Liu, Wenfeng,et al. Correlation Between Dielectric Breakdown and Interface Traps Characteristics[J]. Gaodianya Jishu/High Voltage Engineering,2018,44:432-439. |
| APA | Xie, Dongri,Min, Daomin,Liu, Wenfeng,Li, Shengtao,Kang, Wenbin,&Min, Chao.(2018).Correlation Between Dielectric Breakdown and Interface Traps Characteristics.Gaodianya Jishu/High Voltage Engineering,44,432-439. |
| MLA | Xie, Dongri,et al."Correlation Between Dielectric Breakdown and Interface Traps Characteristics".Gaodianya Jishu/High Voltage Engineering 44(2018):432-439. |
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