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	Structure, binding energy and optoelectrical properties of p-type CuI thin films: The effects of thickness
	Wei Peng; Lingxia Li; Shihui Yu; Haoran Zheng; Pan Yang
刊名	Applied Surface Science
	2019
页码	144424
关键词	X-ray photoelectron spectroscopy Surface CuI Film Optoelectrical
ISSN号	0169-4332
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2903716
专题	天津大学
作者单位	School of Microelectronics and Key Laboratory for Advanced Ceramics and Machining Technology, Tianjin University, Tianjin 300072, PR China
推荐引用方式 GB/T 7714	Wei Peng,Lingxia Li,Shihui Yu,et al. Structure, binding energy and optoelectrical properties of p-type CuI thin films: The effects of thickness[J]. Applied Surface Science,2019:144424.
APA	Wei Peng,Lingxia Li,Shihui Yu,Haoran Zheng,&Pan Yang.(2019).Structure, binding energy and optoelectrical properties of p-type CuI thin films: The effects of thickness.Applied Surface Science,144424.
MLA	Wei Peng,et al."Structure, binding energy and optoelectrical properties of p-type CuI thin films: The effects of thickness".Applied Surface Science (2019):144424.

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