Robust method for interest region description based on local intensity binary pattern | |
Yang, Y.; Duan, F.; Jiang, J.; Ma, L.; Zheng, H. | |
刊名 | Journal of Electronic Imaging
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2017 | |
卷号 | Vol.26 No.4 |
关键词 | binary pattern reference orientation local binary patterns image matching scale invariant feature transform |
ISSN号 | 1017-9909;1560-229X |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2893686 |
专题 | 天津大学 |
作者单位 | Tianjin University, State Key Laboratory of Precision Measurement Technology and Instruments, Tianjin, China |
推荐引用方式 GB/T 7714 | Yang, Y.,Duan, F.,Jiang, J.,et al. Robust method for interest region description based on local intensity binary pattern[J]. Journal of Electronic Imaging,2017,Vol.26 No.4. |
APA | Yang, Y.,Duan, F.,Jiang, J.,Ma, L.,&Zheng, H..(2017).Robust method for interest region description based on local intensity binary pattern.Journal of Electronic Imaging,Vol.26 No.4. |
MLA | Yang, Y.,et al."Robust method for interest region description based on local intensity binary pattern".Journal of Electronic Imaging Vol.26 No.4(2017). |
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