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	Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions
	Yan, H.a,b; Mei, Y.a,b; Li, X.b; Zhang, P.c; Lu, G.-Q.d
刊名	Microelectronics Reliability
卷号	Vol.55 No.12页码:2532-2541
ISSN号	0026-2714
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2890974
专题	天津大学
作者单位	1.aKey Laboratory of Advanced Ceramics and Machining Technology, Ministry of Education, Tianjin University, Tianjin, 300072, China 2.bTianjin Key Laboratory of Advanced Joining Technology, School of Materials Science and Engineering, Tianjin University, Tianjin, 300072, China 3.cState Key Laboratory of Transient Optics and Photonics, Xi'An Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, 710119, China 4.dDepartment of Materials Science and Engineering, Virginia Tech, Blacksburg, VA 24061, United States
推荐引用方式 GB/T 7714	Yan, H.a,b,Mei, Y.a,b,Li, X.b,et al. Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions[J]. Microelectronics Reliability,Vol.55 No.12:2532-2541.
APA	Yan, H.a,b,Mei, Y.a,b,Li, X.b,Zhang, P.c,&Lu, G.-Q.d.
MLA	Yan, H.a,b,et al."Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions".Microelectronics Reliability Vol.55 No.12

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