In-situ experiment on critical thickness of brittle-ductile transition of single-crystal silicon | |
Liu, B.; Xu, Z.-W.; Li, R.; He, Z.-D. | |
刊名 | Gongcheng Kexue Xuebao/Chinese Journal of Engineering |
2019 | |
卷号 | Vol.41 No.3页码:343-349 |
关键词 | Brittle-ductile transition Crystal orientation Online observation Single-crystal silicon Tool edge radius |
ISSN号 | 2095-9389 |
URL标识 | 查看原文 |
内容类型 | 期刊论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/2887757 |
专题 | 天津大学 |
作者单位 | 1.a School of Mechanical Engineering, Tianjin University of Commerce, Tianjin, 300134, China 2.b School of Precision Instrument & Opto-Electronics Engineering, Tianjin University, Tianjin, 300072, China |
推荐引用方式 GB/T 7714 | Liu, B.,Xu, Z.-W.,Li, R.,et al. In-situ experiment on critical thickness of brittle-ductile transition of single-crystal silicon[J]. Gongcheng Kexue Xuebao/Chinese Journal of Engineering,2019,Vol.41 No.3:343-349. |
APA | Liu, B.,Xu, Z.-W.,Li, R.,&He, Z.-D..(2019).In-situ experiment on critical thickness of brittle-ductile transition of single-crystal silicon.Gongcheng Kexue Xuebao/Chinese Journal of Engineering,Vol.41 No.3,343-349. |
MLA | Liu, B.,et al."In-situ experiment on critical thickness of brittle-ductile transition of single-crystal silicon".Gongcheng Kexue Xuebao/Chinese Journal of Engineering Vol.41 No.3(2019):343-349. |
个性服务 |
查看访问统计 |
相关权益政策 |
暂无数据 |
收藏/分享 |
除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。
修改评论