一种半导体结构及其制造方法
殷华湘; 马小龙; 秦长亮; 徐秋霞; 陈大鹏
2016-03-01
著作权人中国科学院微电子研究所
专利号US9276085
国家美国
文献子类发明专利
英文摘要

The present invention provides a semiconductor structure comprising a substrate; a gate stack on the substrate; a spacer on the sidewalls of the gate stack; a source/drain junction extension formed in the substrate on both sides of the gate stack by epitaxial growth; and a source/drain region in the substrate on both sides of the source/drain junction extension. Accordingly, the present invention also provides methods for manufacturing the semiconductor structure. The present invention can provide a source/drain junction extension with a high doping concentration and a low junction depth, thereby effectively improving the performance of the semiconductor structure.

公开日期2013-09-26
申请日期2012-04-26
语种中文
内容类型专利
源URL[http://159.226.55.106/handle/172511/16689]  
专题微电子研究所_集成电路先导工艺研发中心
作者单位中国科学院微电子研究所
推荐引用方式
GB/T 7714
殷华湘,马小龙,秦长亮,等. 一种半导体结构及其制造方法. US9276085. 2016-03-01.
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