Study of wafer thickness scaling in n-type rear-emitter solar cells with different bulk lifetimes

	Study of wafer thickness scaling in n-type rear-emitter solar cells with different bulk lifetimes
	Zhang W(张巍); Chen C(陈晨); Xing Z(邢钊); Sun Y(孙昀); Jia R(贾锐); Jin Z(金智); Liu XY(刘新宇)
刊名	JOURNAL OF APPLIED PHYSICS
	2014-08-05
公开日期	2015-04-16
内容类型	期刊论文
源URL	[http://10.10.10.126/handle/311049/12572]
专题	微电子研究所_高频高压器件与集成研发中心
通讯作者	Jia R(贾锐)
作者单位	中国科学院微电子研究所
推荐引用方式 GB/T 7714	Zhang W,Chen C,Xing Z,et al. Study of wafer thickness scaling in n-type rear-emitter solar cells with different bulk lifetimes[J]. JOURNAL OF APPLIED PHYSICS,2014.
APA	Zhang W.,Chen C.,Xing Z.,Sun Y.,Jia R.,...&Liu XY.(2014).Study of wafer thickness scaling in n-type rear-emitter solar cells with different bulk lifetimes.JOURNAL OF APPLIED PHYSICS.
MLA	Zhang W,et al."Study of wafer thickness scaling in n-type rear-emitter solar cells with different bulk lifetimes".JOURNAL OF APPLIED PHYSICS (2014).