Investigation on the Conductive Filament Growth Dynamics in Resistive Switching Memory via a Universal Monte Carlo Simulator
Li Y(李昱); Zhang MY(张美芸); Long SB(龙世兵); Liu Q(刘琦); Lv HB(吕杭炳); Liu M(刘明)
刊名SCIeNTIfIC REporTS
2017-09-11
文献子类期刊论文
语种英语
内容类型期刊论文
源URL[http://159.226.55.106/handle/172511/18175]  
专题微电子研究所_微电子器件与集成技术重点实验室
作者单位中国科学院微电子研究所
推荐引用方式
GB/T 7714
Li Y,Zhang MY,Long SB,et al. Investigation on the Conductive Filament Growth Dynamics in Resistive Switching Memory via a Universal Monte Carlo Simulator[J]. SCIeNTIfIC REporTS,2017.
APA Li Y,Zhang MY,Long SB,Liu Q,Lv HB,&Liu M.(2017).Investigation on the Conductive Filament Growth Dynamics in Resistive Switching Memory via a Universal Monte Carlo Simulator.SCIeNTIfIC REporTS.
MLA Li Y,et al."Investigation on the Conductive Filament Growth Dynamics in Resistive Switching Memory via a Universal Monte Carlo Simulator".SCIeNTIfIC REporTS (2017).
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