Investigations on the EFT immunity of microcontrollers with different architectures | |
Li BH(李彬鸿) | |
刊名 | Microelectronics Reliability |
2017-07-15 | |
文献子类 | 期刊论文 |
内容类型 | 期刊论文 |
源URL | [http://159.226.55.106/handle/172511/18033] |
专题 | 微电子研究所_硅器件与集成研发中心 |
推荐引用方式 GB/T 7714 | Li BH. Investigations on the EFT immunity of microcontrollers with different architectures[J]. Microelectronics Reliability,2017. |
APA | 李彬鸿.(2017).Investigations on the EFT immunity of microcontrollers with different architectures.Microelectronics Reliability. |
MLA | 李彬鸿."Investigations on the EFT immunity of microcontrollers with different architectures".Microelectronics Reliability (2017). |
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