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	Microcontroller susceptibility variations to EFT burst during accelerated aging
	Li BH(李彬鸿)
刊名	Microelectronics Reliability
	2016-09-18
英文摘要	With deterioration of the electromagnetic environment, microcontroller unit(MCU) electromagnetic susceptibility (EMS) to transient burst interference has become a focus of academia and enterprise. Most electromagnetic compatibility (EMC) studies of MCUs have not taken the effects of aging into account. However, component aging can degrade the physical parameters of an MCU and change its immunity to EMI. This paper proposes a time-equivalent interval accelerated aging methodology combining DC····
内容类型	期刊论文
源URL	[http://159.226.55.106/handle/172511/16153]
专题	微电子研究所_硅器件与集成研发中心
推荐引用方式 GB/T 7714	Li BH. Microcontroller susceptibility variations to EFT burst during accelerated aging[J]. Microelectronics Reliability,2016.
APA	李彬鸿.(2016).Microcontroller susceptibility variations to EFT burst during accelerated aging.Microelectronics Reliability.
MLA	李彬鸿."Microcontroller susceptibility variations to EFT burst during accelerated aging".Microelectronics Reliability (2016).

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