Defect production and annealing induced by electronic energy loss inpure metal
Wang ; ZGDufour ; CHou ; MDJin ; GMJin ; YFPaumier ; EToulemonde
刊名NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM
1998
卷号135期号:1-4页码:265-269
关键词Electronic Energy Loss Thermal Spike Vacancy And Interstitial
ISSN号0168-583X
通讯作者Wang, ZG, Chinese Acad Sci, Inst Modern Phys, POB 31, Lanzhou 730000,
语种英语
公开日期2011-08-26
内容类型期刊论文
源URL[http://ir.imp.cas.cn/handle/113462/10407]  
专题近代物理研究所_近代物理研究所知识存储(2010之前)
推荐引用方式
GB/T 7714
Wang,ZGDufour,CHou,et al. Defect production and annealing induced by electronic energy loss inpure metal[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM,1998,135(1-4):265-269.
APA Wang.,ZGDufour.,CHou.,MDJin.,GMJin.,...&EToulemonde.(1998).Defect production and annealing induced by electronic energy loss inpure metal.NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM,135(1-4),265-269.
MLA Wang,et al."Defect production and annealing induced by electronic energy loss inpure metal".NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM 135.1-4(1998):265-269.
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