Structural and PL properties of Cu-doped ZnO films
Peng, Xingping1,2; Xu, Jinzhang3; Zang, Hang2; Wang, Boyu3; Wang, Zhiguang2
刊名JOURNAL OF LUMINESCENCE
2008-03-01
卷号128期号:3页码:297-300
关键词ZnO films Cu-doped XRD photoluminescence RF sputtering
ISSN号0022-2313
DOI10.1016/j.jlumin.2007.07.016
英文摘要Cu-doped ZnO films with hexagonal wurtzite structure were deposited on silicon (1 1 1) substrates by radio frequency (RF) sputtering technique. An ultraviolet (UV) peak at similar to 380nm and a blue band centered at similar to 430nm were observed in the room temperature photoluminescent (PL) spectra. The UV emission peak was from the exciton transition. The blue emission band was assigned to the Zn interstitial (Zn-i) and Zn vacancy (V-Zn) level transition. A strong blue peak (similar to 435 nm) was observed in the PL spectra when the alpha(Cu) (the area ratio of Cu-chips to the Zn target) was 1.5% at 100 W, and ZnO films had c-axis preferred orientation and smaller lattice mismatch. The influence of alpha(Cu) and the sputtering power on the blue band was investigated. (C) 2007 Published by Elsevier B.V.
WOS关键词ROOM-TEMPERATURE ; THIN-FILMS ; PHOTOLUMINESCENCE ; LUMINESCENCE ; GROWTH
WOS研究方向Optics
语种英语
出版者ELSEVIER SCIENCE BV
WOS记录号WOS:000252566300004
公开日期2010-10-29
内容类型期刊论文
源URL[http://ir.imp.cas.cn/handle/113462/5823]  
专题近代物理研究所_近代物理研究所知识存储(2010之前)
近代物理研究所_先进核能材料研究室(ADS)
通讯作者Peng, Xingping
作者单位1.Lanzhou Univ, Sch Phys Sci & Technol, Lanzhou 73000, Peoples R China
2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 73000, Peoples R China
3.Lanzhou Univ, Sch Nucl Sci & Technol, Lanzhou 73000, Peoples R China
推荐引用方式
GB/T 7714
Peng, Xingping,Xu, Jinzhang,Zang, Hang,et al. Structural and PL properties of Cu-doped ZnO films[J]. JOURNAL OF LUMINESCENCE,2008,128(3):297-300.
APA Peng, Xingping,Xu, Jinzhang,Zang, Hang,Wang, Boyu,&Wang, Zhiguang.(2008).Structural and PL properties of Cu-doped ZnO films.JOURNAL OF LUMINESCENCE,128(3),297-300.
MLA Peng, Xingping,et al."Structural and PL properties of Cu-doped ZnO films".JOURNAL OF LUMINESCENCE 128.3(2008):297-300.
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