Effects of ion irradiation on the diffusion of pre-implanted B atoms in crystalline silicon
Sealy, BJ; Liu, CL; Nejim, A; Gwilliam, RM
刊名HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION
2001-12-01
卷号25期号:1页码:1238-1244
关键词implantation transient enhanced diffusion secondary ion mass spectrometer crystalline silicon
ISSN号0254-3052
英文摘要N-type crystalline Si (100) implanted with 5keV B ions was subsequently irradiated with MeV Si, O and F ions. The B atom profiles were measured by means of secondary ion mass spectrometer after the treatment of rapid thermal annealing. The results show that the transient enhanced diffusion of B atoms is effectively limited by the post-implantation of high energy ions at high dose. At the same irradiation conditions, it is found that the existence of a SiO2 layer in the near surface of Si is even more effective in suppressing the transient enhanced diffusion of the doped B atoms. The results are qualitatively discussed in combination with the analyses of RBS/c measurements and calculation of the DICADA code.
WOS关键词DEFECTS ; SI
WOS研究方向Physics
语种英语
出版者SCIENCE CHINA PRESS
WOS记录号WOS:000172849500017
公开日期2010-10-29
内容类型期刊论文
源URL[http://ir.imp.cas.cn/handle/113462/1501]  
专题近代物理研究所_近代物理研究所知识存储(2010之前)
通讯作者Liu, CL
作者单位1.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China
2.Univ Surrey, Sch Elect Engn Informat Technol & Math, Guildford GU2 7XH, Surrey, England
推荐引用方式
GB/T 7714
Sealy, BJ,Liu, CL,Nejim, A,et al. Effects of ion irradiation on the diffusion of pre-implanted B atoms in crystalline silicon[J]. HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,2001,25(1):1238-1244.
APA Sealy, BJ,Liu, CL,Nejim, A,&Gwilliam, RM.(2001).Effects of ion irradiation on the diffusion of pre-implanted B atoms in crystalline silicon.HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION,25(1),1238-1244.
MLA Sealy, BJ,et al."Effects of ion irradiation on the diffusion of pre-implanted B atoms in crystalline silicon".HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION 25.1(2001):1238-1244.
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