Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source

doi:10.1063/1.2172357

	Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source
	Cao, Y; Sun, LT; Ma, L; Ma, BH; Wang, H; Feng, YC; Li, JY; Zhao, HW; Zhang, ZM; Zhang, XZ
	2006-03
卷号	77
期号	3
DOI	10.1063/1.2172357
英文摘要	With a latest developed electric-sweep scanner system, we have done a lot of experiments for studying this scanner system and ion beam emittance of electron cyclotron resonance (ECR) ion source. The electric-sweep scanner system was installed on the beam line of Lanzhou electron resonance ion source No. 3 experimental platform of Institute of Modem Physics. The repetition experiments have proven that the system is a relatively dependable and reliable emittance scanner, and its experiment error is about 10%. We have studied the influences of the major parameters of ECR ion source on the extracted ion beam emittance. The typical results of the experiments and the conclusions are presented in this article. (c) 2006 American Institute of Physics.
会议录	REVIEW OF SCIENTIFIC INSTRUMENTS
会议录出版者	AMER INST PHYSICS
会议录出版地	CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
语种	英语
WOS研究方向	Instruments & Instrumentation ; Physics
WOS记录号	WOS:000237473200047
内容类型	会议论文
源URL	[http://119.78.100.186/handle/113462/57982]
专题	中国科学院近代物理研究所
通讯作者	Cao, Y
作者单位	Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Gansuo, Peoples R China
推荐引用方式 GB/T 7714	Cao, Y,Sun, LT,Ma, L,et al. Experimental study on the electric-sweep scanner and ion beam emittance of electron cyclotron resonance ion source[C]. 见:.