A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs

doi:10.1063/1.4876597

	A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs
	Shi, Zhan 1,2; Zhao, Ruifeng 1,2; Li, Wenxian 1,2; Tu, Bingsheng 1,2; Yang, Yang 1,2; Xiao, Jun 1,2; Huldt, Sven 3; Hutton, Roger 1,2; Zou, Yaming 1,2
刊名	REVIEW OF SCIENTIFIC INSTRUMENTS
	2014-06-01
卷号	85
ISSN号	0034-6748
DOI	10.1063/1.4876597
文献子类	Article
英文摘要	A portable high resolution soft x-ray and extreme ultraviolet (EUV) spectrometer has been developed for spectroscopic research at the Shanghai Electron Beam Ion Trap (EBIT) laboratory. A unique way of aligning the grazing incidence spectrometer using the zero order of the grating is introduced. This method is realized by extending the range of the movement of the CCD detector to cover the zero order. The alignment can be done in a few minutes, thus leading to a portable spectrometer. The high vacuum needed to be compatible with the EBITs is reached by mounting most of the translation and rotation stages outside the chamber. Only one high vacuum compatible linear guide is mounted inside the chamber. This is to ensure the convenient interchange of the gratings needed to enable wavelength coverage of the whole range of 10 to 500 angstrom. Spectra recorded with one of our low energy EBITs shows that a resolving power of above 800 can be achieved. In the slitless configuration used in this work, we found the resolving power to be limited by the width of the EBIT plasma. When mounted on the Shanghai EBIT which is a high energy EBIT and has a narrower EBIT plasma width, the estimated resolving power will be around 1400 at 221.15 angstrom. (C) 2014 AIP Publishing LLC.
WOS关键词	BEAM ION-TRAP ; CORRECTED CONCAVE GRATINGS ; CHARGED IONS ; SPECTROSCOPY ; TUNGSTEN ; ASTROPHYSICS ; SPECTROGRAPH ; RELEVANT ; EMISSION ; PLASMAS
语种	英语
出版者	AMER INST PHYSICS
WOS记录号	WOS:000339010500011
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/49847]
专题	中国科学院近代物理研究所
通讯作者	Yang, Yang
作者单位	1.Fudan Univ, Inst Modern Phys, IEBIT Lab, Shanghai 200433, Peoples R China 2.Fudan Univ, Key Lab Appl Ion Beam Phys, Minist Educ, Shanghai 200433, Peoples R China 3.Lund Univ, Lund Observ, SE-22100 Lund, Sweden
推荐引用方式 GB/T 7714	Shi, Zhan,Zhao, Ruifeng,Li, Wenxian,et al. A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs[J]. REVIEW OF SCIENTIFIC INSTRUMENTS,2014,85.
APA	Shi, Zhan.,Zhao, Ruifeng.,Li, Wenxian.,Tu, Bingsheng.,Yang, Yang.,...&Zou, Yaming.(2014).A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs.REVIEW OF SCIENTIFIC INSTRUMENTS,85.
MLA	Shi, Zhan,et al."A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs".REVIEW OF SCIENTIFIC INSTRUMENTS 85(2014).