| Outlier-factor-based cluster analysis for infrared image segmentation of electric equipment | |
| Zhang, Panpan; Zhang, Yanbin; Cao, Hui; Liu, Shang; Yan, Dapeng; Yu, Yajie; Zhang, Guifeng; Tian, Zhiren | |
| 2018 | |
| 页码 | 931-936 |
| 会议录 | Proceedings of the 30th Chinese Control and Decision Conference, CCDC 2018
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| URL标识 | 查看原文 |
| ISSN号 | 9781538612439 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/2830534 |
| 专题 | 西安交通大学 |
| 推荐引用方式 GB/T 7714 | Zhang, Panpan,Zhang, Yanbin,Cao, Hui,et al. Outlier-factor-based cluster analysis for infrared image segmentation of electric equipment[C]. 见:. |
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