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	Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP
	Chepelev, Vladimir; Parfenov, Yury; Radasky, William; Titov, Boris; Zdoukhov, Leonid; Li, Kejie; Chen, Yuhao; Kong, Xu; Xie, Yan-zhao
刊名	JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
	2018
卷号	34页码:547-557
关键词	HP EMP Disruptions in electronic devices Key parameters of electromagnetic disturbances HPEM Electromagnetic coupling
ISSN号	0923-8174
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2830087
专题	西安交通大学
推荐引用方式 GB/T 7714	Chepelev, Vladimir,Parfenov, Yury,Radasky, William,et al. Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP[J]. JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,2018,34:547-557.
APA	Chepelev, Vladimir.,Parfenov, Yury.,Radasky, William.,Titov, Boris.,Zdoukhov, Leonid.,...&Xie, Yan-zhao.(2018).Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP.JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS,34,547-557.
MLA	Chepelev, Vladimir,et al."Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP".JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 34(2018):547-557.

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