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	Analysis of the Conduction Process for Active Surge Protection Gap With Combination Wave Energy Injection
	Yao, Xueling; Le, Yangjing; Xu, Wenjun; Han, Pei; Sun, Wei; Chen, Jingliang
刊名	IEEE Transactions on Plasma Science
	2019
卷号	47页码:559-565
关键词	Action timing active coupling trigger Combination waves Impulse breakdown voltages Operating time
ISSN号	0093-3813
URL标识	查看原文
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2826664
专题	西安交通大学
推荐引用方式 GB/T 7714	Yao, Xueling,Le, Yangjing,Xu, Wenjun,et al. Analysis of the Conduction Process for Active Surge Protection Gap With Combination Wave Energy Injection[J]. IEEE Transactions on Plasma Science,2019,47:559-565.
APA	Yao, Xueling,Le, Yangjing,Xu, Wenjun,Han, Pei,Sun, Wei,&Chen, Jingliang.(2019).Analysis of the Conduction Process for Active Surge Protection Gap With Combination Wave Energy Injection.IEEE Transactions on Plasma Science,47,559-565.
MLA	Yao, Xueling,et al."Analysis of the Conduction Process for Active Surge Protection Gap With Combination Wave Energy Injection".IEEE Transactions on Plasma Science 47(2019):559-565.

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