| Stress mapping of a strain superlattice using scanning moiré fringe imaging | |
| Huihui Wen; Hongye Zhang; Zhanwei Liu; Chao Liu; Shuman Liu; Xinan Yang; Fengqi Liu; Huimin Xie | |
| 刊名 | Applied Physics Letters
 |
| 2018 | |
| 卷号 | 113期号:3页码:031905 |
| 内容类型 | 期刊论文 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/29164]  |
| 专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
| 推荐引用方式 GB/T 7714 | Huihui Wen;Hongye Zhang;Zhanwei Liu;Chao Liu;Shuman Liu;Xinan Yang;Fengqi Liu;Huimin Xie. Stress mapping of a strain superlattice using scanning moiré fringe imaging[J]. Applied Physics Letters,2018,113(3):031905. |
| APA | Huihui Wen;Hongye Zhang;Zhanwei Liu;Chao Liu;Shuman Liu;Xinan Yang;Fengqi Liu;Huimin Xie.(2018).Stress mapping of a strain superlattice using scanning moiré fringe imaging.Applied Physics Letters,113(3),031905. |
| MLA | Huihui Wen;Hongye Zhang;Zhanwei Liu;Chao Liu;Shuman Liu;Xinan Yang;Fengqi Liu;Huimin Xie."Stress mapping of a strain superlattice using scanning moiré fringe imaging".Applied Physics Letters 113.3(2018):031905. |
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