| Quantitative evaluation of the interface lattice quality of a strain superlattice by strain analysis | |
| Wen Huihui; Zhang Hongye; Liu Zhanwei; Liu Chao; Liu Shuman; Yang Xinan; Liu Fengqi; Xie Huimin | |
| 刊名 | Nanoscale
 |
| 2018 | |
| 卷号 | 10期号:37页码:17567-17575 |
| 语种 | 英语 |
| 内容类型 | 期刊论文 |
| 源URL | [http://ir.semi.ac.cn/handle/172111/29163]  |
| 专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
| 推荐引用方式 GB/T 7714 | Wen Huihui;Zhang Hongye;Liu Zhanwei;Liu Chao;Liu Shuman;Yang Xinan;Liu Fengqi;Xie Huimin. Quantitative evaluation of the interface lattice quality of a strain superlattice by strain analysis[J]. Nanoscale,2018,10(37):17567-17575. |
| APA | Wen Huihui;Zhang Hongye;Liu Zhanwei;Liu Chao;Liu Shuman;Yang Xinan;Liu Fengqi;Xie Huimin.(2018).Quantitative evaluation of the interface lattice quality of a strain superlattice by strain analysis.Nanoscale,10(37),17567-17575. |
| MLA | Wen Huihui;Zhang Hongye;Liu Zhanwei;Liu Chao;Liu Shuman;Yang Xinan;Liu Fengqi;Xie Huimin."Quantitative evaluation of the interface lattice quality of a strain superlattice by strain analysis".Nanoscale 10.37(2018):17567-17575. |
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