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	Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance
	Wu, Weikang ; An, Xia ; Tan, Fei ; Chen, Yehua ; Liu, Jingjing ; Zhang, Yao ; Zhang, Xing ; Shen, Dongjun ; Guo, Gang ; Huang, Ru
	2015
关键词	current mirrors heavy ions damage mismatch output impedance single event PDSOI MOSFETS VARIABILITY MICRODOSE CIRCUITS DEVICES DESIGN
英文摘要	The impact of a single event on the performance of CMOS current mirrors (CMs) is studied experimentally in this paper. Both basic and cascode CMs based on bulk Si and PDSOI substrates are employed to demonstrate the permanent effects of damage generated by heavy-ion strikes. The results show that the mismatch of the CMs (bulk Si/PDSOI basic/cascode CMs) changes after heavy-ion irradiation, which means that the accuracy of the output current may need re-evaluation when CMs are operated in a harsh environment. For output impedance, a drastic reduction of 40% is observed for small (W/L =.0.5 mu m/0.25 mu m) PDSOI basic CMs. This may limit the application of CMs when high output impedance is required to provide a large gain or common mode rejection ratio. Different types of performance degradation after heavy-ion irradiation are classified, and the characteristics are also statistically compared between different types of CM. The mechanisms of these changes are then discussed and traced back to the damage induced by the random heavy-ion strikes. These results demonstrate the permanent effects of damage generated by heavy-ion strikes in CMOS CMs, and provide insights into the impact of heavy-ion irradiation on analog circuits.; Special Funds for Major State Basic Research (973) Projects of China [2011CBA00601]; NSFC [61421005, 61434007, 60806033, 61474004]; SRFDP [20130001110025]; National ST Major Project [02]; SCI(E); CPCI-S(ISTP); 11; 30
语种	英语
出处	19th International Conference on Microscopy of Semiconducting Materials
DOI标识	10.1088/0268-1242/30/11/115002
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/493280]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Wu, Weikang,An, Xia,Tan, Fei,et al. Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance. 2015-01-01.

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