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A Low Power Self-Turnoff Program Method for One-Time Programmable Memory; A Low Power Self-Turnoff Program Method for One-Time Programmable Memory
Ling Shen ; Yongan Zheng ; Fan Yang ; Huailin Liao ; Yangyuan Wang
2016
关键词breakdown programmable attached Figure embed transistor drain requirement NMOS acceptable breakdown programmable attached Figure embed transistor drain requirement NMOS acceptable
英文摘要A novel self-turnoff control circuit for program process of one-time programmable(OTP) cell is proposed. Utilizing the current turnoff technology after the breakdown of OTP cell, it lowers the power consumption efficiently compared with traditional structures without turnoff mechanism. In addition, an additional delay circuit is also attached to the self-turnoff circuit to ensure the complete breakdown of OTP cell. The simulation results show that the average power consumption of proposed circuit decreases to about 3nA in the whole program process.; A novel self-turnoff control circuit for program process of one-time programmable(OTP) cell is proposed. Utilizing the current turnoff technology after the breakdown of OTP cell, it lowers the power consumption efficiently compared with traditional structures without turnoff mechanism. In addition, an additional delay circuit is also attached to the self-turnoff circuit to ensure the complete breakdown of OTP cell. The simulation results show that the average power consumption of proposed circuit decreases; IEEE Beijing Section; 3
语种英语
内容类型其他
源URL[http://ir.pku.edu.cn/handle/20.500.11897/479823]  
专题信息科学技术学院
推荐引用方式
GB/T 7714
Ling Shen,Yongan Zheng,Fan Yang,et al. A Low Power Self-Turnoff Program Method for One-Time Programmable Memory, A Low Power Self-Turnoff Program Method for One-Time Programmable Memory. 2016-01-01.
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