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Improving DFA attacks on AES with unknown and random faults
Nan LIAO ; Xiaoxin CUI ; Kai LIAO ; Tian WANG ; Dunshan YU ; Xiaole CUI
刊名Science China(Information Sciences)
2017
关键词AES DFA attacks unknown and random faults efficient theoretical candidate number voltage violation
英文摘要Differential fault analysis(DFA) aiming at the advanced encryption standard(AES) hardware implementations has become a widely research topic. Unlike theoretical model, in real attack scenarios, popular and practical fault injection methods like supply voltage variation will introduce faults with random locations,unknown values and multibyte. For analyzing this kind of faults, the previous fault model needed six pairs of correct and faulty ciphertexts to recover the secret round-key. In this paper, on the pr; 04; 166-179
语种英语
内容类型期刊论文
源URL[http://ir.pku.edu.cn/handle/20.500.11897/479638]  
专题信息科学技术学院
推荐引用方式
GB/T 7714
Nan LIAO,Xiaoxin CUI,Kai LIAO,et al. Improving DFA attacks on AES with unknown and random faults[J]. Science China(Information Sciences),2017.
APA Nan LIAO,Xiaoxin CUI,Kai LIAO,Tian WANG,Dunshan YU,&Xiaole CUI.(2017).Improving DFA attacks on AES with unknown and random faults.Science China(Information Sciences).
MLA Nan LIAO,et al."Improving DFA attacks on AES with unknown and random faults".Science China(Information Sciences) (2017).
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