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	A Wafer-level Characterization Method of ESD Protection Circuits for Both Component-level and System-level Applications
	Wang, Yuan ; Lu, Guangyi ; Zhang, Xing
	2016
关键词	Electrostatic discharge (ESD) detection circuit triggering criteria transient-induced latch-up (TLU) CLAMP CIRCUITS DESIGN
英文摘要	Electrostatic discharge (ESD) protection circuits are often designed with detection circuits to trigger clamp devices to bypass ESD currents. In order to fully characterize performance of these protection circuits, a wafer-level characterization method is proposed in this work. By separating the detection rail from the supply rail, triggering actions resulted from detection circuits can be clearly captured by the proposed method. Besides, both the component-level triggering criteria and system-level transient-induced latch-up (TLU) immunity of ESD protection circuits can be fully characterized by the proposed method. Silicon-data based case studies are presented in this work to verify the validity of the proposed method.; CPCI-S(ISTP); wangyuan@pku.edu.cn; 503-506
语种	英语
出处	Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/459870]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Wang, Yuan,Lu, Guangyi,Zhang, Xing. A Wafer-level Characterization Method of ESD Protection Circuits for Both Component-level and System-level Applications. 2016-01-01.

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