Novel DEM Technique for Current-Steering DAC in 65-nm CMOS Technology

doi:10.1587/transele.E98.C.1193

CORC > 北京大学 > 信息科学技术学院

	Novel DEM Technique for Current-Steering DAC in 65-nm CMOS Technology
	Wang, Yuan ; Su, Wei ; Guo, Guangliang ; Zhang, Xing
刊名	IEICE TRANSACTIONS ON ELECTRONICS
	2015
关键词	dynamic element matching (DEM) current-steering digital-to-analog converter (DAC) spurious free dynamic range (SFDR)
DOI	10.1587/transele.E98.C.1193
英文摘要	A novel dynamic element matching (DEM) method, called binary-tree random DEM (BTR-DEM), is presented for a Nyquist-rate current-steering digital-to-analog converter (DAC). By increasing or decreasing the number of unit current sources randomly at the same time, the BTR-DEM encoding reduces switch transition glitches. A 5-bit current-teering DAC with the BTR-DEM technique is implemented in a 65-nm CMOS technology. The measured spurious free dynamic range (SFDR) attains 42 dB for a sample rate of 100 MHz and shows little dependence on signal frequency.; SCI(E); EI; ARTICLE; wangyuan@pku.edu.cn; 12; 1193-1195; E98C
语种	英语
内容类型	期刊论文
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/435732]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Wang, Yuan,Su, Wei,Guo, Guangliang,et al. Novel DEM Technique for Current-Steering DAC in 65-nm CMOS Technology[J]. IEICE TRANSACTIONS ON ELECTRONICS,2015.
APA	Wang, Yuan,Su, Wei,Guo, Guangliang,&Zhang, Xing.(2015).Novel DEM Technique for Current-Steering DAC in 65-nm CMOS Technology.IEICE TRANSACTIONS ON ELECTRONICS.
MLA	Wang, Yuan,et al."Novel DEM Technique for Current-Steering DAC in 65-nm CMOS Technology".IEICE TRANSACTIONS ON ELECTRONICS (2015).