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	Physical origin of data pattern inversion in optical injection-locked VCSELs
	Yang, Weijian ; Guo, Peng ; Parekh, Devang ; Hofmann, Werner ; Amann, Markus C. ; Chang-Hasnain, Connie J.
	2009
英文摘要	The physical origin and criteria for adjustable data pattern inversion in optical injection locked VCSELs are explained with a novel model including the interference effect of master laser reflection. Simulation results agree well with experiments. ? 2009 Optical Society of America.; EI; 0
语种	英语
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/411275]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Yang, Weijian,Guo, Peng,Parekh, Devang,et al. Physical origin of data pattern inversion in optical injection-locked VCSELs. 2009-01-01.

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