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	Co-design of ESD protection and LNA in RFIC
	Hao, Yueguo ; Zhang, Qiao ; Bai, Xiaopeng ; Shi, Zitao ; Ma, Huainan ; Cheng, Yuhua
	2013
英文摘要	This paper introduces a new FoM (figure of merit) to evaluate the overall performance of ESD and LNA and presents a design procedure of establishing a standard library of ESD protection cells to reduce the design time and complexity for RFIC designer. The electrostatic discharge protection cells have been designed in a 0.35??m BiCMOS process. The ESD robustness and RF characteristics will be verified when the RF chip is done. ? 2013 IEEE.; EI; 0
语种	英语
DOI标识	10.1109/ASICON.2013.6812038
内容类型	其他
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/410702]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Hao, Yueguo,Zhang, Qiao,Bai, Xiaopeng,et al. Co-design of ESD protection and LNA in RFIC. 2013-01-01.

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