Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack | |
Wu, Xing ; Pey, Kin-Leong ; Raghavan, Nagarajan ; Liu, Wen-Hu ; Li, Xiang ; Bai, Ping ; Zhang, Gang ; Bosman, Michel | |
刊名 | nanotechnology
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2011 | |
关键词 | TRANSITION-METAL OXIDES DIELECTRIC-BREAKDOWN SILICON DIOXIDE THIN-FILMS MEMORY RELIABILITY NANOFILAMENTS FABRICATION DEVICES LAYERS |
DOI | 10.1088/0957-4484/22/45/455702 |
英文摘要 | We apply our understanding of the physics of failure in the post-breakdown regime of high-kappa dielectric-based conventional logic transistors having a metal-insulator-semiconductor (MIS) structure to interpret the mechanism of resistive switching in resistive random-access memory (RRAM) technology metal-insulator-metal (MIM) stacks. Oxygen vacancies, gate metal migration and metal filament formation in the gate dielectric which constitute the chemistry of breakdown in the post-breakdown stage of logic gate stacks are attributed to be the mechanisms responsible for the SET process in RRAM technology. In this paper, we draw an analogy between the breakdown study in logic devices and filamentation physics in resistive non-volatile memory.; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied; SCI(E); EI; 5; ARTICLE; 45; 22 |
语种 | 英语 |
内容类型 | 期刊论文 |
源URL | [http://ir.pku.edu.cn/handle/20.500.11897/394117] ![]() |
专题 | 信息科学技术学院 |
推荐引用方式 GB/T 7714 | Wu, Xing,Pey, Kin-Leong,Raghavan, Nagarajan,et al. Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack[J]. nanotechnology,2011. |
APA | Wu, Xing.,Pey, Kin-Leong.,Raghavan, Nagarajan.,Liu, Wen-Hu.,Li, Xiang.,...&Bosman, Michel.(2011).Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack.nanotechnology. |
MLA | Wu, Xing,et al."Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack".nanotechnology (2011). |
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