Automated identification of symmetry in CBED patterns: a genetic   approach

doi:10.1016/S0304-3991(00)00006-1

CORC > 北京大学 > 信息科学技术学院

	Automated identification of symmetry in CBED patterns: a genetic approach
	Hu, GB ; Peng, LM ; Yu, QF ; Lu, HQ
刊名	ultramicroscopy
	2000
关键词	CBED symmetry image processing ELECTRON-DIFFRACTION
DOI	10.1016/S0304-3991(00)00006-1
英文摘要	The genetic algorithm has been applied for automated identification of symmetry in CBED patterns. A normalized inner product between an original and its symmetry operated CBED patterns was found to be a good measure of similarity between them, and this inner product was used as the objective function in the genetic algorithm. A real floating number implementation of this genetic approach has been applied successfully in identifying rotation axes and mirror planes in experimental CBED patterns obtained from a single crystal of silicon. In particular a three-fold rotation axis reflecting the true three-dimensional symmetry of silicon is clearly distinguished from a six-fold rotation axis as expected from a two-dimensional crystal in the experimental (1 1 1) zone axis CBED pattern. (C) 2000 Elsevier Science B.V. All rights reserved.; Microscopy; SCI(E); EI; 2; ARTICLE; 1-2; 47-56; 84
语种	英语
内容类型	期刊论文
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/257763]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Hu, GB,Peng, LM,Yu, QF,et al. Automated identification of symmetry in CBED patterns: a genetic approach[J]. ultramicroscopy,2000.
APA	Hu, GB,Peng, LM,Yu, QF,&Lu, HQ.(2000).Automated identification of symmetry in CBED patterns: a genetic approach.ultramicroscopy.
MLA	Hu, GB,et al."Automated identification of symmetry in CBED patterns: a genetic approach".ultramicroscopy (2000).