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Proportional difference operator method and its application in studying subthreshold behavior of MOSFETs
Tan, CH ; Xu, MZ ; Wang, Z
刊名固体电子学
2000
关键词RELAXATION SPECTROSCOPY THRESHOLD EXTRACTION MOS STRUCTURES TRAP
DOI10.1016/S0038-1101(99)00318-4
英文摘要The proportional difference operator (PDO) method is presented to study the subthreshold behavior of MOSFETs. By applying the PDO, acting on an expression for the drain current in the subthreshold region, a new proportional difference characteristic of MOSFET can be obtained. The analytical results show that the proportional difference of the subthreshold equation is a peak function. Its peak position, being dependent on the measurement voltage, is related to the characteristic parameters, so the most important parameters (such as thermal and threshold voltages) can be easily obtained. A surface potential approximation has been developed and implemented in studying a MOSFET's proportional difference subthreshold behaviors. The relationships between the classical threshold voltage and the Lindner threshold voltage are also discussed. Values of voltage constants are shown to agree well with those obtained by standard methods. (C) 2000 Elsevier Science Ltd. All rights reserved.; Engineering, Electrical & Electronic; Physics, Applied; Physics, Condensed Matter; SCI(E); 6; ARTICLE; 6; 1059-1067; 44
语种英语
内容类型期刊论文
源URL[http://ir.pku.edu.cn/handle/20.500.11897/213616]  
专题信息科学技术学院
推荐引用方式
GB/T 7714
Tan, CH,Xu, MZ,Wang, Z. Proportional difference operator method and its application in studying subthreshold behavior of MOSFETs[J]. 固体电子学,2000.
APA Tan, CH,Xu, MZ,&Wang, Z.(2000).Proportional difference operator method and its application in studying subthreshold behavior of MOSFETs.固体电子学.
MLA Tan, CH,et al."Proportional difference operator method and its application in studying subthreshold behavior of MOSFETs".固体电子学 (2000).
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