Linewidth measurement of Littrow structure semiconductor laser with   improved methods

doi:10.1016/j.physleta.2008.03.039

CORC > 北京大学 > 信息科学技术学院

	Linewidth measurement of Littrow structure semiconductor laser with improved methods
	Zhou, Wu ; Chong, Kin Man ; Guo, Hong
刊名	physics letters a
	2008
关键词	semiconductor laser frequency noise linewidth homodyne heterodyne HIGH-POWER LIMIT NOISE DELAY
DOI	10.1016/j.physleta.2008.03.039
英文摘要	In this Letter, the frequency noise spectrum is analyzed in the experiment of the laser linewidth measurement. The power spectrum of three most widely used laser linewidth measurement methods, i.e., the heterodyne measurement, the self-homodyne measurement and the self-heterodyne measurement, are restudied both theoretically and experimentally. A scheme adopting an avalanche photodetector (APD) in the delayed self-heterodyne (DSHT) method is proposed, and an indirect determined result is given. Crown Copyright (C) 2008 Published by Elsevier B.V. All rights reserved.; http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000256572100034&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=8e1609b174ce4e31116a60747a720701 ; Physics, Multidisciplinary; SCI(E); 6; ARTICLE; 23; 4327-4332; 372
语种	英语
内容类型	期刊论文
源URL	[http://ir.pku.edu.cn/handle/20.500.11897/152924]
专题	信息科学技术学院
推荐引用方式 GB/T 7714	Zhou, Wu,Chong, Kin Man,Guo, Hong. Linewidth measurement of Littrow structure semiconductor laser with improved methods[J]. physics letters a,2008.
APA	Zhou, Wu,Chong, Kin Man,&Guo, Hong.(2008).Linewidth measurement of Littrow structure semiconductor laser with improved methods.physics letters a.
MLA	Zhou, Wu,et al."Linewidth measurement of Littrow structure semiconductor laser with improved methods".physics letters a (2008).