Effect of target shape on fast electron emission in femtosecond laser-plasma interactions | |
Li, Y. T.1; Xu, M. H.1; Yuan, X. H.1; Wang, W. M.1; Chen, M.1; Zheng, Z. Y.1; Sheng, Z. M.1,3; Yu, Q. Z.1; Zhang, Y.1; Liu, F.1 | |
刊名 | physical review e |
2008 | |
卷号 | 77期号:1页码:16406 |
ISSN号 | 1539-3755 |
英文摘要 | fast electron emission from the interaction of femtosecond laser pulses with shaped solid targets has been studied. it is found that the angular distributions of the forward fast electrons are highly dependent upon the target shapes. the important roles played by the electrostatic fields built up at the non-laser-irradiated target surfaces and the collisions in the target are identified. our two-dimensional particle-in-cell simulations with binary collisions included reproduce the main experimental observations. |
学科主题 | 物理科学和化学 |
WOS标题词 | science & technology ; physical sciences |
类目[WOS] | physics, fluids & plasmas ; physics, mathematical |
研究领域[WOS] | physics |
关键词[WOS] | solid targets ; transport ; matter ; rays ; inhibition ; pulses ; photon ; beams |
收录类别 | SCI ; EI |
语种 | 英语 |
WOS记录号 | WOS:000252861600042 |
公开日期 | 2011-09-30 |
内容类型 | 期刊论文 |
源URL | [http://ir.opt.ac.cn/handle/181661/10863] |
专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
作者单位 | 1.Chinese Acad Sci, Inst Phys, Beijing Natl Lab Condensed Matter Phys, Beijing 100080, Peoples R China 2.Chinese Acad Sci, State Key Lab Transient Opt Technol, Xian 710068, Peoples R China 3.Shanghai Jiao Tong Univ, Dept Phys, Shanghai 200240, Peoples R China |
推荐引用方式 GB/T 7714 | Li, Y. T.,Xu, M. H.,Yuan, X. H.,et al. Effect of target shape on fast electron emission in femtosecond laser-plasma interactions[J]. physical review e,2008,77(1):16406. |
APA | Li, Y. T..,Xu, M. H..,Yuan, X. H..,Wang, W. M..,Chen, M..,...&Zhang, J..(2008).Effect of target shape on fast electron emission in femtosecond laser-plasma interactions.physical review e,77(1),16406. |
MLA | Li, Y. T.,et al."Effect of target shape on fast electron emission in femtosecond laser-plasma interactions".physical review e 77.1(2008):16406. |
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