2 000~2 800 eV软X光入射CsI(TI)闪烁体的探测效率标定

doi:10.3788/IRLA201847.0917003

	2 000~2 800 eV软X光入射CsI(TI)闪烁体的探测效率标定
	Wei, Minxi; Wang, Jing; Zhang, Wenhai; Yang, Guohong; Zheng, Lei; 郑雷
刊名	红外与激光工程
	2018
卷号	47 期号:9 页码:251-256
ISSN号	1007-2276
DOI	10.3788/IRLA201847.0917003
其他题名	Detection efficiency calibraion of CsI(TI) scintillator with 2 000-2 800 eV soft X-ray incidence
文献子类	Article
英文摘要	CsI (Tl) scintillator is a key part for the transition from X -ray to visible light, its transition efficiency is of crucial importance in X-ray diagnosis for inertial confined fusion. X-rays could deposit energies into the CsI (Tl) scintillator and visible lights were emitted. The detection efficiency of CsI(Tl) scintillator with different thickness was calibrated on the beamline 4B7A at Beijing Synchrotron Radiation Facility in the energy range between 2 000 eV and 2 800 eV. Energy deposition and energy response with the stimulation of X-ray were studied. The whole system included emitting X-ray, standard detector, shutter, CsI (Tl) scintillator, black box and SI1000 CCD. Emitting X-ray was normalized with curve fitting. SI1000 CCD was used to receive the visible light which the counts were kept in the linearity range of CCD. The experiment gets the detector current, CCD counts, the ratio of CCD counts and emitting X-ray counts in the energy region from 2 000 eV to 2 800 eV. The results show the detection efficiency increase with the increase of the thickness of CsI (Tl) scintillator. The experimental method makes foundation for the subsequent selection of a suitable thickness of scintillator of soft X-ray detection. © 2018, Editorial Board of Journal of Infrared and Laser Engineering. All right reserved.
语种	中文
CSCD记录号	CSCD:6335577
内容类型	期刊论文
源URL	[http://ir.ihep.ac.cn/handle/311005/286983]
专题	高能物理研究所_多学科研究中心中国科学院高能物理研究所_中国散裂中子源
作者单位	中国科学院高能物理研究所
推荐引用方式 GB/T 7714	Wei, Minxi,Wang, Jing,Zhang, Wenhai,等. 2 000~2 800 eV软X光入射CsI(TI)闪烁体的探测效率标定[J]. 红外与激光工程,2018,47(9):251-256.
APA	Wei, Minxi,Wang, Jing,Zhang, Wenhai,Yang, Guohong,Zheng, Lei,&郑雷.(2018).2 000~2 800 eV软X光入射CsI(TI)闪烁体的探测效率标定.红外与激光工程,47(9),251-256.
MLA	Wei, Minxi,et al."2 000~2 800 eV软X光入射CsI(TI)闪烁体的探测效率标定".红外与激光工程 47.9(2018):251-256.