Effect of doping concentration on point defect structure in As-implanted ZnO
Yuan MY(苑梦尧); Wang, HH; Yuan, MY; Wang HH(王焕华)
刊名SOLID STATE COMMUNICATIONS
2017
卷号261页码:41-45
关键词P-type ZnO Ion implantation Diffuse x-ray scattering Point defects
ISSN号0038-1098
DOI10.1016/j.ssc.2017.04.021
文献子类Article
英文摘要The effect of doping concentration on the point defect structure of As-implanted ZnO single crystal was investigated using diffuse x-ray scattering and photoluminescence spectroscopy. Based on the assumption that the low-dose ion implantation did not shift the phonon dispersion of the lattice, Huang diffuse scattering signals were obtained by subtracting thermal diffuse scattering intensities. We found that the point defects aggregate into defect clusters after annealing, and their average size decreases and concentration increases with increasing the doping concentration. The underlying mechanisms of this counter-intuition result were suggested.
电子版国际标准刊号1879-2766
WOS关键词X-RAY-SCATTERING ; THIN-FILMS ; LATTICE ; SI
WOS研究方向Physics
语种英语
WOS记录号WOS:000405690400009
内容类型期刊论文
源URL[http://ir.ihep.ac.cn/handle/311005/284931]  
专题高能物理研究所_多学科研究中心
作者单位中国科学院高能物理研究所
推荐引用方式
GB/T 7714
Yuan MY,Wang, HH,Yuan, MY,et al. Effect of doping concentration on point defect structure in As-implanted ZnO[J]. SOLID STATE COMMUNICATIONS,2017,261:41-45.
APA 苑梦尧,Wang, HH,Yuan, MY,&王焕华.(2017).Effect of doping concentration on point defect structure in As-implanted ZnO.SOLID STATE COMMUNICATIONS,261,41-45.
MLA 苑梦尧,et al."Effect of doping concentration on point defect structure in As-implanted ZnO".SOLID STATE COMMUNICATIONS 261(2017):41-45.
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