Concentrated-Mass Cantilever Enhances Multiple Harmonics In Tapping-Mode Atomic Force Microscopy

CORC > 力学研究所 > 中国科学院力学研究所 > 力学所知识产出(1956-2008)

	Concentrated-Mass Cantilever Enhances Multiple Harmonics In Tapping-Mode Atomic Force Microscopy
	Li HL(李晖凌); Chen Y(陈艳); Dai LH(戴兰宏)
刊名	Applied Physics Letters
	2008
通讯作者邮箱	lihl@lnm.imech.ac.cn
关键词	Generation Surfaces
ISSN号	0003-6951
通讯作者	Li, HL (reprint author), Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech LNM, Beijing 100190, Peoples R China.
中文摘要	The natural frequencies of a cantilever probe can be tuned with an attached concentrated mass to coincide with the higher harmonics generated in a tapping-mode atomic force microscopy by the nonlinear tip-sample interaction force. We provide a comprehensive map to guide the choice of the mass and the position of the attached particle in order to significantly enhance the higher harmonic signals containing information on the material properties. The first three eigenmodes can be simultaneously excited with only one carefully positioned particle of specific mass to enhance multiple harmonics. Accessing the interaction force qualitatively based on the high-sensitive harmonic signals combines the real-time material characterization with the imaging capability. (C) 2008 American Institute of Physics.
类目[WOS]	Physics, Applied
研究领域[WOS]	Physics
关键词[WOS]	GENERATION ; SURFACES
收录类别	SCI ; EI
语种	英语
WOS记录号	WOS:000255117100024
公开日期	2009-08-03 ; 2009-09-14
内容类型	期刊论文
源URL	[http://dspace.imech.ac.cn/handle/311007/26070]
专题	力学研究所_力学所知识产出(1956-2008)
推荐引用方式 GB/T 7714	Li HL,Chen Y,Dai LH. Concentrated-Mass Cantilever Enhances Multiple Harmonics In Tapping-Mode Atomic Force Microscopy[J]. Applied Physics Letters,2008.
APA	李晖凌,陈艳,&戴兰宏.(2008).Concentrated-Mass Cantilever Enhances Multiple Harmonics In Tapping-Mode Atomic Force Microscopy.Applied Physics Letters.
MLA	李晖凌,et al."Concentrated-Mass Cantilever Enhances Multiple Harmonics In Tapping-Mode Atomic Force Microscopy".Applied Physics Letters (2008).