Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.

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	Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.
	Wang, Y ; Shen, DY ; Qian, RY
刊名	ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY
	1998-08-23
卷号	216 页码:U100-U101
ISSN号	0065-7727
语种	英语
出版者	AMER CHEMICAL SOC
WOS记录号	WOS:000075235100337
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/74403]
专题	中国科学院化学研究所
作者单位	1.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China 2.Univ Massachusetts, Dept Polymer Sci & Engn, Amherst, MA 01003 USA
推荐引用方式 GB/T 7714	Wang, Y,Shen, DY,Qian, RY. Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY,1998,216:U100-U101.
APA	Wang, Y,Shen, DY,&Qian, RY.(1998).Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films..ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY,216,U100-U101.
MLA	Wang, Y,et al."Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.".ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 216(1998):U100-U101.