Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films. | |
Wang, Y; Shen, DY; Qian, RY | |
刊名 | ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY
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1998-08-23 | |
卷号 | 216页码:U100-U101 |
ISSN号 | 0065-7727 |
语种 | 英语 |
出版者 | AMER CHEMICAL SOC |
WOS记录号 | WOS:000075235100337 |
内容类型 | 期刊论文 |
源URL | [http://ir.iccas.ac.cn/handle/121111/74403] ![]() |
专题 | 中国科学院化学研究所 |
作者单位 | 1.Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China 2.Univ Massachusetts, Dept Polymer Sci & Engn, Amherst, MA 01003 USA |
推荐引用方式 GB/T 7714 | Wang, Y,Shen, DY,Qian, RY. Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.[J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY,1998,216:U100-U101. |
APA | Wang, Y,Shen, DY,&Qian, RY.(1998).Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films..ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY,216,U100-U101. |
MLA | Wang, Y,et al."Studies on origin of stress yield peak for amorphous poly(ethylene terephthalate) films.".ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY 216(1998):U100-U101. |
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