Analysis of lateral force contribution to the topography in contact mode AFM

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	Analysis of lateral force contribution to the topography in contact mode AFM
	Shang, G; Qiu, X; Wang, C; Bai, C
刊名	APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
	1998-03-01
卷号	66 页码:S333-S335
ISSN号	0947-8396
英文摘要	We employed a simple method to quantitatively analyze normal and lateral forces in contact mode AFM with the laser-beam deflection system. Taking into account the behavior of the cantilever and properties of the sample surface, the relationship between the applied forces and the properties (the local slope and local friction coefficient) of the surface have been established. It is shown that the lateral force could be playing an important role in cantilever deflection and could result in significant distortion of the topographic images. This work may benefit the analysis of the surface topography obtained by contact mode AFM.
语种	英语
出版者	SPRINGER VERLAG
WOS记录号	WOS:000076887000070
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/74375]
专题	中国科学院化学研究所
通讯作者	Bai, C
作者单位	Chinese Acad Sci, Inst Chem, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Shang, G,Qiu, X,Wang, C,et al. Analysis of lateral force contribution to the topography in contact mode AFM[J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,1998,66:S333-S335.
APA	Shang, G,Qiu, X,Wang, C,&Bai, C.(1998).Analysis of lateral force contribution to the topography in contact mode AFM.APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING,66,S333-S335.
MLA	Shang, G,et al."Analysis of lateral force contribution to the topography in contact mode AFM".APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 66(1998):S333-S335.