A scanning force microscope combined with a scanning electron microscope for multidimensional data analysis

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	A scanning force microscope combined with a scanning electron microscope for multidimensional data analysis
	Troyon, M ; Lei, HN ; Wang, ZH ; Shang, GY
刊名	MICROSCOPY MICROANALYSIS MICROSTRUCTURES
	1997-12-01
卷号	8 期号:6 页码:393-402
ISSN号	1154-2799
英文摘要	A Scanning Force Microscope (SFM) intended for operation inside a Scanning Electron Microscope (SEM) is described. This combined instrument allows one to image a sample conventionally by SEM and to investigate by SFM the local topography as well as certain physical characteristics of the surface (friction, elasticity...). The combination of the two microscopes is very attractive because they complement each other in terms of depth of field, lateral and vertical resolution, field of view, speed and ability to image insulating surfaces. A multidimensional data space relative to the same area of a sample surface can be constructed, which should help to give new insights into the nature of materials.
语种	英语
出版者	E D P SCIENCES
WOS记录号	WOS:000075278500004
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/74111]
专题	中国科学院化学研究所
通讯作者	Troyon, M
作者单位	1.Lab Microscopies Elect & Tunnel, Unite Therm & Anal Phys, EA 2061, F-51685 Reims 2, France 2.Chinese Acad Sci, Inst Chem, STM Lab, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Troyon, M,Lei, HN,Wang, ZH,et al. A scanning force microscope combined with a scanning electron microscope for multidimensional data analysis[J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES,1997,8(6):393-402.
APA	Troyon, M,Lei, HN,Wang, ZH,&Shang, GY.(1997).A scanning force microscope combined with a scanning electron microscope for multidimensional data analysis.MICROSCOPY MICROANALYSIS MICROSTRUCTURES,8(6),393-402.
MLA	Troyon, M,et al."A scanning force microscope combined with a scanning electron microscope for multidimensional data analysis".MICROSCOPY MICROANALYSIS MICROSTRUCTURES 8.6(1997):393-402.