Principle and Applications of Scanning Ion Conductance Microscopy

doi:10.3724/SP.J.1096.2010.01821

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	Principle and Applications of Scanning Ion Conductance Microscopy
	Ji Tian-Rong; Liang Zhong-Wei; Zhu Xin-Yu; Shao Yuan-Hua
刊名	CHINESE JOURNAL OF ANALYTICAL CHEMISTRY
	2010-12-01
卷号	38 期号:12 页码:1821-1827
关键词	Scanning Ion Conductance Microscopy Principle Applications Review
ISSN号	0253-3820
DOI	10.3724/SP.J.1096.2010.01821
英文摘要	Scanning ion conductance microscopy (SICM) is one type of scanning probe microscopy (SPM) techniques. By measuring the ionic current of an ultra-micropipette, it can be used to map the surface topography of a sample at high resolution without any contact. SICM has many remarkable advantages, such as high spatial resolution, simple preparation of the probe and no damage to the sample surface, particularly suitable for imaging living cells under physiological condition. Therefore, SICM is an important scanning probe microscopy technique complementary to scanning electrochemical microscopy and atomic force microscopy. SICM has been employed to image soft interfaces and surfaces, such as cell surface and its microstructure. In addition, SICM can be used in conjunction with other techniques to study the relationship between cell topography and function; it can also control the deposition of specific molecules to achieve nanometer-scale microscopic operation and fabrication. Herein, the history, principle, instrumentation, applications and prospects of SICM have been reviewed.
语种	英语
出版者	ELSEVIER SCIENCE INC
WOS记录号	WOS:000287782500028
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/70767]
专题	中国科学院化学研究所
通讯作者	Ji Tian-Rong
作者单位	Peking Univ, Coll Chem & Mol Engn, Inst Analyt Chem, Beijing Natl Lab Mol Sci, Beijing 100871, Peoples R China
推荐引用方式 GB/T 7714	Ji Tian-Rong,Liang Zhong-Wei,Zhu Xin-Yu,et al. Principle and Applications of Scanning Ion Conductance Microscopy[J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,2010,38(12):1821-1827.
APA	Ji Tian-Rong,Liang Zhong-Wei,Zhu Xin-Yu,&Shao Yuan-Hua.(2010).Principle and Applications of Scanning Ion Conductance Microscopy.CHINESE JOURNAL OF ANALYTICAL CHEMISTRY,38(12),1821-1827.
MLA	Ji Tian-Rong,et al."Principle and Applications of Scanning Ion Conductance Microscopy".CHINESE JOURNAL OF ANALYTICAL CHEMISTRY 38.12(2010):1821-1827.