Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films

doi:10.1016/j.susc.2005.01.033

CORC > 化学研究所 > 中国科学院化学研究所

	Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films
	Lin, Y; Xiao, XR; Li, XP; Zhou, XW
刊名	SURFACE SCIENCE
	2005-03-20
卷号	579 期号:1 页码:37-46
关键词	Atomic Force Microscopy Titanium Oxide Semiconducting Surfaces Surface Chemical Reaction Fractal Surface Surface Structure Morphology Toughness And Topography
ISSN号	0039-6028
DOI	10.1016/j.susc.2005.01.033
英文摘要	Surface morphologies of nanocrystalline TiO2 thin films were studied by analyzing the surface profile of AFM images using wavelet transform method. Based on characterizing the fractal feature and computing the image details at different orientations and resolutions, the surface textures of nanocrystalline TiO2 thin films before and after chemical treatment were examined. The results reveal that titanium isopropoxide treatment leads to an increase of surface roughness. The related mechanism of modification of the microstructure by chemical treatment associated with the improvement of the photocurrent response is discussed. (c) 2005 Elsevier B.V. All rights reserved.
语种	英语
出版者	ELSEVIER SCIENCE BV
WOS记录号	WOS:000227850300005
内容类型	期刊论文
源URL	[http://ir.iccas.ac.cn/handle/121111/56369]
专题	中国科学院化学研究所
通讯作者	Xiao, XR
作者单位	Chinese Acad Sci, Inst Chem, Ctr Mol Sci, Key Lab Photochem, Beijing 100080, Peoples R China
推荐引用方式 GB/T 7714	Lin, Y,Xiao, XR,Li, XP,et al. Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films[J]. SURFACE SCIENCE,2005,579(1):37-46.
APA	Lin, Y,Xiao, XR,Li, XP,&Zhou, XW.(2005).Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films.SURFACE SCIENCE,579(1),37-46.
MLA	Lin, Y,et al."Wavelet analysis of the surface morphologic of nanocrystalline TiO2 thin films".SURFACE SCIENCE 579.1(2005):37-46.