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Radiative recombination characteristics in gaas multilayer n(+)-i interfaces
Shen, WZ; Jiang, LF; Yu, G; Lai, ZY; Wang, XG; Shen, SC; Cao, X
刊名Journal of applied physics
2001-11-15
卷号90期号:10页码:5444-5446
ISSN号0021-8979
通讯作者Shen, wz()
英文摘要In this communication, we have carried out a detailed investigation of radiative recombination in n-gaas homojunction far-infrared detector structures with multilayer emitter (n(+))-intrinsic (i) interfaces by temperature-dependent steady-state photoluminescence measurements. the observation of the emitter-layer luminescence structures has been identified from their luminescence characteristics, in combination with high density theoretical calculation. a photogenerated carrier transferring model has been proposed, which can well explain the dependencies of the luminescence intensities on the laser excitation intensity and temperature. furthermore, the obtained radiative recombination behavior helps us to offer a proposal to improve the operating temperature of the detector. (c) 2001 american institute of physics.
WOS关键词FAR-INFRARED DETECTORS ; SI-DOPED GAAS ; PHOTOLUMINESCENCE ; LAYERS
WOS研究方向Physics
WOS类目Physics, Applied
语种英语
出版者AMER INST PHYSICS
WOS记录号WOS:000171918700089
内容类型期刊论文
URI标识http://www.corc.org.cn/handle/1471x/2429027
专题半导体研究所
通讯作者Shen, WZ
作者单位1.Shanghai Jiao Tong Univ, Dept Phys, Lab Condensed Matter Spect & Optoelect Phys, Shanghai 200030, Peoples R China
2.Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
3.Chinese Acad Sci, Inst Semicond, New Mat Dept, Beijing 100083, Peoples R China
推荐引用方式
GB/T 7714
Shen, WZ,Jiang, LF,Yu, G,et al. Radiative recombination characteristics in gaas multilayer n(+)-i interfaces[J]. Journal of applied physics,2001,90(10):5444-5446.
APA Shen, WZ.,Jiang, LF.,Yu, G.,Lai, ZY.,Wang, XG.,...&Cao, X.(2001).Radiative recombination characteristics in gaas multilayer n(+)-i interfaces.Journal of applied physics,90(10),5444-5446.
MLA Shen, WZ,et al."Radiative recombination characteristics in gaas multilayer n(+)-i interfaces".Journal of applied physics 90.10(2001):5444-5446.
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