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	Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers
	Qu, B; Zheng, XH; Wang, YT; Feng, ZH; Han, JY; Liu, S; Lin, SM; Yang, H; Liang, JW
刊名	Science in china series a-mathematics physics astronomy
	2001-04-01
卷号	44期号:4页码:497-503
关键词	Four-circle diffraction Gan Phase content
ISSN号	1006-9283
通讯作者	Qu, b()
英文摘要	On the basis of integrated intensity of rocking curves, the multiplicity factor and the diffraction geometry factor for single crystal x-ray diffraction (xrd) analysis were proposed and a general formula for calculating the content of mixed phases was obtained. with a multifunction four-circle x-ray double-crystal diffractometer, pole figures of cubic (002), {111} and hexagonal {1010} and reciprocal space mapping were measured to investigate the distributive character of mixed phases and to obtain their multiplicity factors and diffraction geometry factors. the contents of cubic twins and hexagonal inclusions were calculated by the integrated intensities of rocking curves of cubic (002), cubic twin {111}, hexagonal {1010} and {1011}.
WOS关键词	MOLECULAR-BEAM EPITAXY ; GAN FILMS ; GROWTH ; STABILITY ; RATIO
WOS研究方向	Mathematics
WOS类目	Mathematics, Applied ; Mathematics
语种	英语
出版者	SCIENCE PRESS
WOS记录号	WOS:000168510300011
内容类型	期刊论文
URI标识	http://www.corc.org.cn/handle/1471x/2428968
专题	半导体研究所
通讯作者	Qu, B
作者单位	1.Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China 2.Chinese Acad Geol Sci, Inst Mineral Deposits, Beijing 100083, Peoples R China
推荐引用方式 GB/T 7714	Qu, B,Zheng, XH,Wang, YT,et al. Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers[J]. Science in china series a-mathematics physics astronomy,2001,44(4):497-503.
APA	Qu, B.,Zheng, XH.,Wang, YT.,Feng, ZH.,Han, JY.,...&Liang, JW.(2001).Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers.Science in china series a-mathematics physics astronomy,44(4),497-503.
MLA	Qu, B,et al."Multiplicity factor and diffraction geometry factor for single crystal x-ray diffraction analysis and measurement of phase content in cubic gan/gaas(001) epilayers".Science in china series a-mathematics physics astronomy 44.4(2001):497-503.

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